|
|
本文章最後由 jojoling 於 2015-5-19 01:55 PM 編輯
簡易晶體測試器痞酷板BIOS更新：
changlog.txt 部份內容在此文最後面。
此板BIOS與前板的差異：
1.加入阿魔修改的中文字顯示與設定。
http://bbs.pigoo.com/thread-56434-1-1.html
2.PIGOO LOGO 更改, logo 來源為：
http://bbs.pigoo.com/thread-54427-1-1.html
3.此板本有打開額外的功能，長按 Test key的話，會進入選單~不同的按鍵，是依照按的秒數不同來模擬。
4.移除額外 relay 保護的程式，此程式其實早已有內建 (後續補充截圖)。
完整程式，更新到官方最新 20150515 rev 488
20150515_TTester_rev488_SRC.zip
(1.63 MB, 下載次數: 41)
此zip為只放 BIOS ，裏面有 4個資料夾
20150511_TTester_rev488_BIN.zip
(119.75 KB, 下載次數: 31)
V10:為舊板的機器
V20:為新板的機器(就是底下展示圖片的機型)
V10_ORG:此為在 V10上跑的最接近原始的BIOS，就是沒logo沒額外增加中文圖示之類的。
V20_ORG: 同上，但是可以跑在新板的機器上
新的 logo：
此台為 gkjnn 大的 ，剛好做這次展示機。
測試時的畫面
changelog.txt裏的資訊，經由 google 翻譯(德文->英文)，紅色為我標示的重要功能修改：
Description of LCD_SPI_OPEN_COL option for the SPI interface.
Description of Chinese WEI_M8 board.
Separation of the display in normal pinout table and STRIP_LINE_BOARD.
Mention of RDSon value in e-MOS transistors.
Supplement describing the NO_LONG_PINLAYOUT option.
Description of the option DC_PWR (upper limit of the battery power).
Circuit for Arduino Mega (ATmega2560) supplemented.
Additional filtering in VCC supply of SSD1306 display adds.
Beschreinung the Fish8840 changes supplemented.
New menu items for ohmmeter and capacitor measuring function.
Description of automatic capacitor measuring function.
Description of automatic Ohmmeter function.
Description SSD1306 connection with I2C interface.
Description of these options BIG_TP and INVERSE_TP.
Problem with the recognition of a protection diode in bipolar transistors (Germaniun) described high residual current ICE0.
Draft interface for a display with ST7108 Controller by a 74HC164 chip.
Supplemented connect a graphical display with ST7920 Controller.
1.11 / 07.02.2015
Expanded description of the pulse encoder tests.
Expanded description of programming.
ESR measurement documented with 8US pulses.
Description of these options for SSD1306 controller with I2C interface:
WITH_LCD_ST7565 = 1306 = 2 and LCD_INTERFACE_MODE LCD_I2C_ADDR.
New option LCD_ST7565_H_OFFSET to better align the horizontal display window location.
Description ESR measurement revised.
Description of the functions and index contrast data supplemented.
Pin assignment of the pulse encoder on PD1 (LCD D5) changed.
Description of the pin assignment of display ports for different ATmega.
Description of the extended circuit with ATmega644 / 1284th
Description of connecting a graphical display controller with ST7565.
Description of the Makefile option WITH_VEXT supplemented for external voltage measurement.
Pulse encoder type 4 for Up / Down button and type 5 for the highest resolution of the encoder.
Description Extension pulse encoder for menu operations supplemented.
Adjustment of the quartz frequency supplemented with 1PPS signal of a GPS receiver.
In the preface: Thanks to more than one installed.
Description for the ST7565 controller (options) adds.
Description of auxiliary function self test, complete test only with menu function,
when with menu, makes direct self-test only calibration with external capacitor only the first time.
Description of auxiliary function pulse encoders.
1.10 / 04.09.2014
Some errors with larger and smaller characters eliminated.
The Operation section revised for menu function.
The chapter features redesigned for menu functions.
Description of the measuring method for separate C + ESR measurement.
Additional query for false detection of TRIAC supplemented as npnp.
Beschreigung the frequency generator and the pulse width generator.
Description of the Makefile options TQFP_ADC6 and TQFP_ADC7 supplements.
Description of the method of frequency measurement supplemented.
Description of choice of additional functions with the menu function: frequency measurement frequency generator
Change in the detection of the depletion type modified in the schedule.
Schedule for thyristor and TRIAC recognition adds.
Description of Cursor Activation supplemented with uncalibrated tester.
Transistor measurement examples drawn in a ttinfo.pdf.
Correction schedule for D-Mos recognition.
Extended schedule to IGBT recognition
Description of the issue of collector leakage currents.
Adapted schedule of transistor tests.
Description collector residual current investigation for germanium and JFET.
Simplified flowchart of the transistor tests supplemented.
1.09 / 30.11.2013
Description of the Makefile options NO_COMMON_COLLECTOR_HFE, NO_COMMON_EMITTER_HFE and NO_TEST_T1_T7.
Supplement the Lithuanian language.
Recalling the necessary Press the start button to start the self-test completed.
Corrigendum Display time to 28 seconds.
1.08 / 01.10.2013
In BAT_POOR level below 3.25V the warning level is only 0.2V higher.
Supplementing LCD_DOGM option in the Configuration chapter.
Supplement of Russian and Ukrainian language.
Description of current gain in collector and emitter circuit adapted.
Description of residual current measurement supplemented with individual diodes.
Adjusted limit for the detection of the depletion FET.
Supplementing protugiesischen language LANG_BRASIL
Supplement of parameter BitClock for avrdude when configuring in the Makefile.
Supplement of Programmers Notepad pictures in the hardware section.
Supplement of ESR measurements of various electrolyte Kondenstoren.
1.07 / 04.19.2013
Description of NO_NANO option adds.
Subchapter of the capacitor measurement adds to tension loss VLOSS.
Resistance measurement of less than 10 ohms with new ESR measurement method supplemented as a table.
Kalibrationsanweisungen and characteristics adapted to the new ESR measurement.
New ESR measurement method described with measurement examples.
Conversion BAT_POOR level described in mV units at below 1.3V 0.1V only Warnoffest.
ESR measurement from 0.45uF described with 500kHz ADC clock with measurement examples.
Description of the resolution of the inductance 0.1mH or 0.01mH supplemented.
1.06 / 23.02.2013
Description Option REF_L_KORR supplements.
Choice for pinout 321 = ... supplemented.
Option external voltage measurement in the hardware section and configuration adds.
Error with missing pull-up in the hardware chapter supplements.
Subchapter China Clone complements the hardware chapter.
Subchapter retrofitting old tester in the hardware chapter supplements.
Typos ESR measurements eliminated.
Description of INHIBIT_SLEEP_MODE option complements the configuration part.
1.05 / 19.01.2013
Expansion supplemented with relay protection in the hardware section.
Oscillogram of ESR measurement of a 4.4uF capacitor adds.
Serial output PC3 complemented in the circuit diagram.
Supplementing RESTART_DELAY_TICS option for the sleep mode without quartz.
Supplementary documentation self-test voltage divider 470k / 680th
Troubleshooting Hardware supplemented with LED indication.
Oscilloscope image of 50Hz test signal complement (self-test).
Notices for gate threshold voltage of MOS transistors E-supplemented
1.04 / 01.12.2012
Instructions J-FET / D MOS measurement
Instructions NPN, PNP transistor measure
Option EBC_STYLE supplemented in the configuration part
Semiconductor testing with ATmega8 and ATmega168 repeated.
Revised Instructions
1.03 / 24.11.2012
Thanks to participants completed the preface.
Results of Resistance Measurement of 9 ATmega8 supplemented.
Results of measurement of capacitor 9 ATmega8 supplements.
Options C_MESS and R_MESS removed for configuration.
1.02 / 01.11.2012
Description of the changes to the stripline version adds.
Other examples of inductance measurements supplemented.
Methods of measurement of inductors without 680 Ohm resistor to a resistance value of 24 ohms, 8 ohms not.
1.01 / 19.10.2012
Inductance resistors with smaller 2100 Ohm, not 2800 ohms.
English description of inductance adds.
Supplement of example measurements for ESR measurement.
Supplementing the capacitor chapter to the description of the ESR measurement.
1.00 / 23.9.2012
Ergängung the JFET measurement.
Supplement Chapter inductance.
Restriction hFE <65536 is omitted, adapted text.
Description of UF_OUT_MV option removed option is omitted.
Explanation of the self-test functions and adds converted for differential outputs.
Examples of Auto Calibration of resistance measurement inserted.
0.99 / 15.8.2012
Examples of Auto Calibration of Kondenstormessung inserted.
Described autocalibration for capacitor measurements.
Zeroing for capacitors and pin output resistance adjustment described.
Error during the measurement capacitor with more film capacitors instead of electrolytic capacitors.
Error history of uncorrected condenser measurement for each 3 mega168, mega168A and mega168PA inserted.
Chapter inserted Instructions
In the described configuration Anzeigeverlaengerung at multiple measurement by pressing and holding the start button.
0.98 / 26.7.2012
Description of the new option C_H_KORR for large capacitors.
Description of the Makefile option UF_OUT_MV supplemented.
Change the Makefile option REF_KORR to REF_C_KORR, tentatively inserted REF_R_KORR.
Adjustments to the resistance measurement.
Error curves of the resistance measurement with minimum and maximum values of 10 measurements.
0.97 / 09.06.2012
first transistor tester documentation in German and English
參考資訊：
原始連結
http://bbs.pigoo.com/thread-50557-1-1.html
PROISP 1.72 教學
http://bbs.pigoo.com/forum.php?m ... mp;extra=#pid610609
fuse 設定值與寫入問題(19樓)
http://bbs.pigoo.com/forum.php?m ... mp;extra=#pid638277
relay 改裝 (50樓) (已不需要)
http://bbs.pigoo.com/forum.php?m ... mp;extra=#pid614672
改機理由原始討論
http://bbs.pigoo.com/thread-50424-1-1.html
簡易晶體測試器新BIOS更新[20140911]
http://bbs.pigoo.com/thread-53119-1-1.html
阿魔更新：
簡易晶體測試器 PIGOO BIOS 1.12.1m (base on 1.12k R464)
http://bbs.pigoo.com/thread-56434-1-1.html
duke83大的硬體升級：
電晶體測試器的升級與進化
http://bbs.pigoo.com/thread-56366-1-1.html
|
評分
-
11
查看全部評分
-
|
/1 
發表於 2015-5-19 13:48:25
發表於 2015-5-20 11:49:48
樓主
打算等天亮時，多拿些零件來測試。